BAI helps microscopes find the most informative nanoscale features in a sample
Researchers at the Department of Energy's Oak Ridge National Laboratory (ORNL) have developed an artificial intelligence framework that helps researchers use atomic force microscopes to identify important nanoscale features while autonomously targeting the most informative areas of a sample for closer study.
Researchers at the Department of Energy's Oak Ridge National Laboratory (ORNL) have developed an artificial intelligence framework that helps researchers use atomic force microscopes to identify important nanoscale features while autonomously targeting the most informative areas of a sample for closer study.
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